Test instrument with multiple analog modules

Details Test instrument with multiple analog modules Test instrument with multiple analog modules

2005-03-22

2005-03-22

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

06870384

ABSTRACT:
An analog test instrument used in an apparatus for testing electronic devices has multiple analog modules for supplying test signals to analog pins of a device under test and receiving response signals from the analog pins. The analog modules may be of the same type or of different types. The analog test instrument also has programmable devices that control in an independent manner the triggering, clocking, and generation of the test signals supplied by each of the analog modules, so that test signals of various timings, speeds and waveforms may be generated.

REFERENCES:
patent: 5173904 (1992-12-01), Daniels et al.
patent: 5379308 (1995-01-01), Nhuyen et al.
patent: 5717329 (1998-02-01), Lee
patent: 5731701 (1998-03-01), Lee
patent: 6483338 (2002-11-01), Weng et al.

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