4. Data processing: measuring, calibrating, or testing
  5. Testing system
  6. For transfer function determination

Paolo Dalla Ricca

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Generating pulses in analog channel of ATE tester

Data processing: measuring – calibrating – or testing – Testing system – For transfer function determination
Patent

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Low-jitter clock for test system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Method and apparatus for use of high sampling frequency A/D...

Pulse or digital communications – Synchronizers – Synchronizing the sampling time of digital data
Reexamination Certificate

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Programmable multi-function module for automatic test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Programmable multi-function module for automatic test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1433127

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