Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-09-06
2005-09-06
Wilczewski, Mary (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S410000
Reexamination Certificate
active
06940118
ABSTRACT:
A semiconductor device has a gate dielectric film formed of zirconium oxide or hafnium oxide as a chief material and a gate electrode film in contact with the gate dielectric film on one principal surface side of a silicon substrate. The gate dielectric film contains an addition element to prevent diffusion of oxygen.
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Ikeda Shuji
Iwasaki Tomio
Miura Hideo
Moriya Hiroshi
Lewis Monica
Renesas Technology Corporation
Townsend and Townsend / and Crew LLP
Wilczewski Mary
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