Methods for planarization of group VIII metal-containing...

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S692000, C438S693000

Reexamination Certificate

active

06884723

ABSTRACT:
A planarization method includes providing a second and/or third row Group VIII metal-containing surface (preferably, a platinum-containing surface) and positioning it for contact with a polishing surface in the presence of a planarization composition that includes a complexing agent.

REFERENCES:
patent: 4035500 (1977-07-01), Dafter, Jr.
patent: 4297436 (1981-10-01), Kubotera et al.
patent: 4670306 (1987-06-01), Salem
patent: 4747907 (1988-05-01), Acocella et al.
patent: 4992137 (1991-02-01), Cathey, Jr. et al.
patent: 5254217 (1993-10-01), Maniar et al.
patent: 5318927 (1994-06-01), Sandhu et al.
patent: 5378492 (1995-01-01), Mashiko
patent: 5380401 (1995-01-01), Jones et al.
patent: 5392189 (1995-02-01), Fazan et al.
patent: 5480854 (1996-01-01), Rajaram et al.
patent: 5527423 (1996-06-01), Neville et al.
patent: 5575885 (1996-11-01), Hirabayashi et al.
patent: 5692950 (1997-12-01), Rutherford et al.
patent: 5695384 (1997-12-01), Beratam
patent: 5700383 (1997-12-01), Feller et al.
patent: 5711851 (1998-01-01), Blalock et al.
patent: 5786259 (1998-07-01), Kang
patent: 5888906 (1999-03-01), Sandhu et al.
patent: 5916855 (1999-06-01), Avanzino et al.
patent: 5935871 (1999-08-01), Farkas et al.
patent: 5954997 (1999-09-01), Kaufman et al.
patent: 5958794 (1999-09-01), Bruxvoort et al.
patent: 5976928 (1999-11-01), Kirlin et al.
patent: 5981454 (1999-11-01), Small
patent: 5989988 (1999-11-01), Iinuma et al.
patent: 6015506 (2000-01-01), Streinz et al.
patent: 6039633 (2000-03-01), Chopra
patent: 6045716 (2000-04-01), Walsh et al.
patent: 6069080 (2000-05-01), James et al.
patent: 6071816 (2000-06-01), Watts et al.
patent: 6110830 (2000-08-01), Skrovan et al.
patent: 6143191 (2000-11-01), Baum et al.
patent: 6143192 (2000-11-01), Westmoreland
patent: 6149828 (2000-11-01), Vaartstra
patent: 6211034 (2001-04-01), Visokay et al.
patent: 6261157 (2001-07-01), Bajaj et al.
patent: 6278153 (2001-08-01), Kikuchi et al.
patent: 6290736 (2001-09-01), Evans
patent: 6306012 (2001-10-01), Sabde
patent: 6346741 (2002-02-01), Van Buskirk et al.
patent: 6368518 (2002-04-01), Vaartstra
patent: 6395194 (2002-05-01), Russell et al.
patent: 6436723 (2002-08-01), Tomita et al.
patent: 6451214 (2002-09-01), Westmoreland
patent: 6454957 (2002-09-01), Westmoreland
patent: 6476491 (2002-11-01), Harada et al.
patent: 6527622 (2003-03-01), Brusic et al.
patent: 6527818 (2003-03-01), Hattori et al.
patent: 6537462 (2003-03-01), Westmoreland
patent: 6589100 (2003-07-01), Moeggenborg et al.
patent: 6730592 (2004-05-01), Vaartstra
patent: 6756308 (2004-06-01), Small et al.
patent: 20010006031 (2001-07-01), Tsuchiya et al.
patent: 20010023701 (2001-09-01), Aoki et al.
patent: 20010039766 (2001-11-01), Hattori et al.
patent: 20020008265 (2002-01-01), Beitel et al.
patent: 20020017063 (2002-02-01), Beitel et al.
patent: 20020019088 (2002-02-01), Basceri et al.
patent: 20020039839 (2002-04-01), Thomas et al.
patent: 20020050322 (2002-05-01), Kunisawa et al.
patent: 20020081853 (2002-06-01), Beitel et al.
patent: 20020111026 (2002-08-01), Small et al.
patent: 20020111027 (2002-08-01), Sachan et al.
patent: 20020151177 (2002-10-01), Cherian et al.
patent: 20030119316 (2003-06-01), Klein et al.
patent: 20030119321 (2003-06-01), Uhlenbrock et al.
patent: 20030119426 (2003-06-01), Sabde
patent: 20030121891 (2003-07-01), Westmoreland
patent: 20030166337 (2003-09-01), Wang et al.
patent: 20040157458 (2004-08-01), Vaartstra
patent: 1 111 083 (2001-06-01), None
patent: 1 123 956 (2001-08-01), None
patent: 1 156 091 (2001-11-01), None
patent: 2000 200782 (2002-07-01), None
patent: WO 9806541 (1998-02-01), None
patent: WO 9836045 (1998-08-01), None
patent: WO 9927581 (1999-06-01), None
patent: WO 9953532 (1999-10-01), None
patent: WO 0031794 (2000-06-01), None
patent: WO 0077107 (2000-12-01), None
patent: WO 0144396 (2001-06-01), None
patent: WO 02084718 (2002-10-01), None
patent: WO 03056620 (2003-07-01), None
patent: WO 03059571 (2003-07-01), None
patent: WO 03060028 (2003-07-01), None
patent: WO 03060980 (2003-07-01), None
Weast et al., “CRC Handbook of Chemistry and Physics,”Chemical Rubber Publishing Company, 1989: D151-154.
Canterford et al., “Chapter 9: Rhodium and Iridium,”Halides of the Transition Elements, Halides of the Second and Third Row Transition Metals, John Wiley & Sons, New York, NY, 1968; pp. 346-357, publication page, title page (14 pages total).
DeOrnellas et al., “Challenges for Plasma Etch Integration of Ferroelectric Capacitors in FeRAM's and DRAM's,”Integrated Ferroelectrics, 1997;17:395-402.
DeOrnellas et al., “Plasma Etch of Ferroelectric Capacitors in FeRAMs and DRAMs,”Semiconductor International, Sep. 1997; pp. 103-104, 106 and 108.
Ginzburg et al.,Analytical Chemistry of Platinum Metals, John Wiley & Sons, New York, cover pg., and 14-15.
Kim et al., “Chemical Dry Etching pf Platinum Using Cl2/CO Gas Mixture,”Chem. Mater., 1998; 10:3576-3582.
Kwon et al., “Etching properties of Pt thin films by inductively coupled plasma,”J. Vac. Sci. Technol., 1998;A 16(5):2772-6.
Nakao, “Dissolution of Noble Metals in Halogen-Halide-Polar Organic Solvent Systems,”J. Chem. Soc., Chem. Commun., Mar. 1, 1992; 5:426-7.
Wilberg,Lehrbuch der Anorganischen Chemie, Walter de Gruyter, Berlin, 1985, Cover pg., and 1188.
Xu et al., “Chemical Vapor Deposition (CVD) of Iridium and Platinum Films and Gas-Phase Chemical Etching of Iridium Thin Films,”Mat. Res. Soc. Symp. Proc., 1999;541:129-139.
Webster's II, New Riverside University Dictionary, 1984: pp. 258, 842.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Methods for planarization of group VIII metal-containing... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods for planarization of group VIII metal-containing..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods for planarization of group VIII metal-containing... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3391771

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.