Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate
2005-01-25
2005-01-25
Le, Thong Q. (Department: 2818)
Static information storage and retrieval
Systems using particular element
Flip-flop
C365S205000
Reexamination Certificate
active
06847542
ABSTRACT:
An SRAM cell comprising a first inverter comprising a first load element and a first driver NMOSFET, a second inverter comprising a second load element and a second driver NMOSFET and having input and output terminals cross-coupled to output and input terminals of the first inverter, respectively, a first transfer gate NMOSFET having a current path inserted between the first inverter and a first bit line and a gate connected to a word line, and a second transfer gate NMOSFET having a current path inserted between the second inverter and a second bit line and a gate connected to the word line, wherein a current drivability of the first inverter and the first transfer gate NMOSFET for the first bit line is set to be larger than that of the second inverter and the second transfer gate NMOSFET for the second bit line.
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Kevin Zhang, et al., “The Scaling of Data Sensing Schemes for High Speed Cache Design in Sub-0.18μm Technologies”, 2000 Smyposium on VLSI Circuits Digest of Technical Papers, 2000, pp. 226-227.
Kabushiki Kaisha Toshiba
Le Thong Q.
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