Methods of manufacturing semiconductor devices

Semiconductor device manufacturing: process – Making field effect device having pair of active regions...

Reexamination Certificate

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C438S199000, C438S583000, C438S682000

Reexamination Certificate

active

06864126

ABSTRACT:
A method of manufacturing a semiconductor device with a transistor comprising an LDD region and a silicide layer is disclosed. The method may include forming a gate electrode on a substrate, forming a first preliminary source/drain region with shallow junction through an ion implantation process using the gate electrode as a mask, and forming a ILD pattern with contact holes on the substrate including the gate electrode, the contact holes exposing the top of the gate electrode and some part of the first preliminary source/drain region. The method may also include forming an expanded source/drain region through an ion implantation process using the ILD pattern as a mask, forming a silicide layer on the top of the gate electrode and the expanded source/drain region, and forming contact plugs by filling the contact holes with metal.

REFERENCES:
patent: 4946799 (1990-08-01), Blake et al.
patent: 5427964 (1995-06-01), Kaneshiro et al.
patent: 5508212 (1996-04-01), Wang et al.
patent: 5668024 (1997-09-01), Tsai et al.
patent: 5672544 (1997-09-01), Pan
patent: 5744395 (1998-04-01), Shue et al.
patent: 5858846 (1999-01-01), Tsai et al.
patent: 5918130 (1999-06-01), Hause et al.
patent: 6017798 (2000-01-01), Ilderem et al.
patent: 6057185 (2000-05-01), Suenaga
patent: 6087234 (2000-07-01), Wu
patent: 6087235 (2000-07-01), Yu
patent: 6096591 (2000-08-01), Gardner et al.
patent: 6163059 (2000-12-01), Hause et al.
patent: 6316811 (2001-11-01), Pey
patent: 6465294 (2002-10-01), Tsai et al.
patent: 6521540 (2003-02-01), Li

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