Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-07-26
2005-07-26
Thompson, A. M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C703S013000, C703S014000, C717S128000
Reexamination Certificate
active
06922821
ABSTRACT:
Checking the consistency of a lock step process while debugging a microcontroller code is in progress. A method provides a production microcontroller to execute an instruction code and provides the result of the instruction code to an ICE. The ICE, independent from the production microcontroller and simultaneously, executes the same instruction code and produces a result. The ICE compares the result of its computation and the result received from the production microcontroller. The ICE issues a “lock step error” when the result of the comparison is a mismatch. A trace buffer residing in the host device provides the location of the line of code causing the mismatch. After identifying the line of code causing the mismatch the user debugs the erroneous line of code. The debugging process resumes on the next line of code in the microcontroller code under test.
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Cypress Semiconductor Corp.
Murabito & Hao LLP
Thompson A. M.
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