Semiconductor integrated circuit with internal compensation for

Details Semiconductor integrated circuit with internal compensation for Semiconductor integrated circuit with internal compensation for

1995-05-30

1996-01-16

Callahan, Timothy P.

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Having specific delay in producing output waveform

327265, 327270, 327271, 327273, 327279, 327293, 327395, 327400, H03H 1126, H03K 104, H03K 17296, H03K 1728

Patent

active

054851149

ABSTRACT:
A semiconductor integrated circuit detecting a change in the internal propagation delay and self-compensating such a change. A combination of semiconductor integrated circuits can self-compensate a change in the total propagation delay of the circuit. There is provided a ring oscillator composed of dummy device elements separate from an actually-used logic circuit portion. The oscillating pulses of the ring oscillator are counted relative to a reference pulse signal. The semiconductor integrated circuit has a delay time compensation control circuit block which generates control data used to compensate the change in the propagation delay based on the difference between the first-counted value and a subsequently counted value. In a combination of semiconductor integrated circuits, the delay time compensation control circuit block may be provided for each channel. Alternatively, the delay time compensation control circuit block may be provided for common use by many channels.

REFERENCES:
patent: 4684897 (1987-08-01), Richards et al.
patent: 4845390 (1989-07-01), Chan
patent: 4902986 (1990-02-01), Lesmeister
patent: 5073733 (1991-12-01), Tanno et al.
patent: 5087842 (1992-02-01), Pulsipher et al.
patent: 5093584 (1992-03-01), Woyke et al.
patent: 5175452 (1992-12-01), Lupi et al.
Lesmesiter, "A Densely Integrated High Performance CMOS Tester", International Test Conference, 1991, pp. 426-429.

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