Address generating circuit

Static information storage and retrieval – Read/write circuit – Having fuse element

Reexamination Certificate

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Details

C385S046000, C385S046000

Reexamination Certificate

active

06552946

ABSTRACT:

BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to an address generating circuit and particularly to a redundant address generating circuit for storing an address of a defective memory cell (hereafter referred to as redundant address) in the memory cell array of a RAM (Random Access Memory), and generating the redundant address when the power supply of the RAM is turned ON.
2. Description of the Related Art
FIGS.
1
(
a
) and
1
(
b
) are schematic diagrams of an address generating circuit of the conventional art.
FIG.
1
(
a
) is a circuit diagram illustrating an address generating circuit of the conventional art. In this figure,
41
is a first switch transistor consisting of PMOS transistor,
42
is a fuse element,
43
is a latch circuit,
44
is an inverter and
45
is a power-ON reset circuit.
In the address generating circuit of the conventional art illustrated in FIG.
1
(
a
), a first switch transistor
41
and a fuse element
42
are connected sequentially in series between the power supply source V
DD
and the ground V
SS
. A latch circuit
43
is comprised of two inverters. The input terminal of one inverter and the output terminal of the other inverter are mutually connected. The input node of the latch circuit
43
is connected to the connection node A of the first switch transistor
41
and fuse element
42
, while the output node in the opposite side is connected to the inverter
44
.
The power-ON reset circuit
45
outputs a reset signal RES. The reset signal RES is inputted to the gate of the first switch transistor
41
. The fuse element
42
is selectively set in the cut-off condition or no cut-off condition in accordance with the address to be generated. Thereby, the binary information can be stored.
FIG.
1
(
b
) is a waveform diagram illustrating the waveform of the reset signal RES to be inputted to the gate of the first switch.transistor
41
. In this figure, the lateral axis t indicates the time, while the vertical axis V indicates voltage and t
0
indicates the time when the power supply is turned ON.
As illustrated in FIG.
1
(
b
), when the power supply is turned ON at time t
0
, the potential of the power supply source V
DD
rises with passage of time. When it reaches the predetermined power supply voltage, for example, 3.3V, it is maintained at this power supply voltage. Meanwhile, the power-ON reset circuit
45
operates in response to such rising of the level of the power supply source V
DD
and outputs the reset signal RES. The reset signal RES holds the ground potential until the time t
1
is delayed as much as the predetermined time from the time t
0
(t
0
is the time when the power supply is turned ON), and has the waveform following the rising of the level of the power supply source V
DD
after the time t
1
. Namely, the reset signal RES has the waveform whereby the level rises like a step at the time t
1
as illustrated in FIG.
1
(
b
).
Next, operations of the address generating circuit of FIG.
1
(
a
) will be explained with reference to the waveform of the reset signal RES of FIG.
1
(
b
).
Since the reset signal RES is held at the ground potential up to time t
1
from time t
0
after the power supply is turned ON, the first switch transistor
41
is turned ON. Therefore, the charges are supplied to the node A from the power supply source V
DD
and thereby the node A is held at a certain positive potential.
At the time t
1
, the level of the reset signal RES rises like a step as illustrated in FIG.
1
(
b
) and thereby the first switch transistor
41
is turned OFF. Therefore, when the fuse element
42
is in the no cut-off condition, charges accumulated in the node A transfer to the ground V
SS
via the fuse element
42
and the input node of the latch circuit
43
is held at the ground potential. Meanwhile, when the fuse element
42
is in the cut-off condition, certain charges are held in the node A and the potential of the input node of the latch circuit
43
is held at the certain positive potential.
Therefore, after the power supply is turned ON, the H level or L level is latched at the latch circuit
43
in accordance with the cut-off or no cut-off condition of the fuse element
42
. When the fuse element
42
is set in the cut-off condition, the H level signal is outputted to the inverter
44
from the latch circuit
43
. When the fuse element
42
is set in the non cut-off condition, the L level signal is outputted to the inverter
44
. Accordingly, an address (binary information) stored in the address generating circuit is outputted via the inverter
44
.
However, in the address generating circuit of the conventional art explained above, during the period when the power supply is turned OFF from being turned ON, a large voltage corresponding to the power supply voltage is always applied between both ends of the fuse element
42
in the fuse element
42
during the cut-off condition. Thereby, a small amount of current flows steadily through the fuse element
42
.
Namely, the fuse element
42
actually has a resistance of about several M &OHgr; even when it is in the cut-off condition. Therefore, even when the fuse element
42
is in the cut-off condition, a current path is steadily formed via the input node of the latch circuit
43
, fuse element
42
and ground V
SS
. Since the input node of latch circuit
43
is in the H level when the fuse element
42
is in the cut-off condition, a small amount of current leaks between the node (H level) of the latch circuit
43
and the ground V
SS
and steadily flows in the fuse element
42
of the cut-off condition.
Due to such steady current leak, the glow-back phenomenon is caused in the material (for example, Al, Cu) of the fuse element
42
. While the cycle of power supply between ON and OFF is repeated for many times, the fuse element
42
of the cut-off condition is connected again after the gradual change by the glow-back phenomenon and thereby the resistance value is reduced. As a result, a problem arises when even if the fuse is set in the cut-off condition, the address corresponding to the no cut-off condition of the fuse is generated due to erroneous data latch of the cut-off information of the fuse.
Furthermore, as the related art of the present invention, there may be a fuse ROM circuit disclosed in Japanese Patent Laid-open Publication No. 8-321197.
The fuse ROM circuit has a ROM cell where a fuse element, a first switch transistor and a second switch transistor are sequentially connected in series between the power supply source V
DD
and the ground V
SS
The connection node of the first switch transistor and the second switch transistor is connected to the node of a latch circuit. The fuse ROM circuit further has a gate control circuit which outputs a control signal for controlling the ON/OFF conditions of the first switch transistor and second switch transistor.
This gate control circuit controls the ON/OFF conditions of the first switch transistor and the second switch transistor after the power supply is turned ON and after the level of the power supply source V
DD
is stabilized at the predetermined voltage, for example, to 3.3V. Therefore, a longer period of time is required until the cut-off information of the fuse element is latched in the latch circuit after the power supply is turned ON.
BRIEF SUMMARY OF THE INVENTION
The present invention has been proposed considering the problems explained above, and therefore it is a general objective of the present invention to provide an address generating circuit which can accurately latch the cut-off information of the fuse and output the accurate address by preventing re-connection of the fuse element due to the glow-back phenomenon even if the cycle of the power supply between the state of ON and OFF is repeated.
Another and a more specific objective of the present invention is to provide an address generating circuit comprising: a first switch transistor of which one end is connected to a power supply source and the other end is connected to a first node; a second switch transistor

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