Method and apparatus for operating nonvolatile memory cells...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S068000, C257SE21008, C257S092000, C257S127000, C257S646000, C257S662000

Reexamination Certificate

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07321145

ABSTRACT:
A nonvolatile memory cell with a charge storage structure is read by measuring current (such as band-to-band current) between the substrate region of the memory cell and at least one of the current carrying nodes of the memory cell. To enhance the operation of the nonvolatile memory cell, the band structure engineering is used to alter the band structure between a bulk part of the device and another part of the device supporting the measurement current.

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