Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2008-01-22
2008-01-22
Nhu, David (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S068000, C257SE21008, C257S092000, C257S127000, C257S646000, C257S662000
Reexamination Certificate
active
07321145
ABSTRACT:
A nonvolatile memory cell with a charge storage structure is read by measuring current (such as band-to-band current) between the substrate region of the memory cell and at least one of the current carrying nodes of the memory cell. To enhance the operation of the nonvolatile memory cell, the band structure engineering is used to alter the band structure between a bulk part of the device and another part of the device supporting the measurement current.
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Tsai Wen Jer
Yeh Chih Chieh
Haynes Beffel & Wolfeld LLP
Macronix International Co. Ltd.
Nhu David
Suzue Kenta
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