Semiconductor device and short circuit detecting method

Details Semiconductor device and short circuit detecting method Semiconductor device and short circuit detecting method

2008-01-29

2008-01-29

Phung, Anh (Department: 2824)

Static information storage and retrieval

Systems using particular element

Semiconductive

C365S063000

Reexamination Certificate

active

07324373

ABSTRACT:
A short circuit detection region includes an insulating film, plural first conductor traces and plural second conductor traces which are embedded in the insulating film with only their surfaces being exposed, and the first conductor trace is constructed by integrally forming a band-shaped portion and plural via portions which are electrically connected to a silicon semiconductor substrate.

REFERENCES:
patent: 6555922 (2003-04-01), Nakagawa
Patent Abstract of Japan, publication No. 2001305194, dated Oct. 31, 2001.
Patent Abstract of Japan, publication No. 2002203882, dated Jul. 19, 2002.

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