Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2008-01-01
2008-01-01
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
C702S099000, C702S133000, C374S102000, C374S169000, C327S512000, C365S211000, C377S025000
Reexamination Certificate
active
07315792
ABSTRACT:
A temperature detector and method of detecting a shifted temperature provides multiple detected temperature points using a single branch. The temperature detector generates multiple detected temperature points in response to temperature control signals sequentially generated in a single branch. Since a shifted temperature for the single branch is found and a trimming operation in response to the shifted temperature is carried out, the test time is reduced. Various refresh periods can be set in response to various trip point temperatures and thus power consumption of a DRAM can be decreased.
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Kim Nam-jong
Min Young-Sun
Barlow John
Samsung Electronics Co,. Ltd.
Vo Hien
Volentine & Whitt PLLC
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