Semiconductor memory device having test circuit

Details Semiconductor memory device having test circuit Semiconductor memory device having test circuit

2011-03-29

2011-03-29

Dinh, Son (Department: 2824)

Static information storage and retrieval

Read/write circuit

Testing

C365S189050, C365S203000

Reexamination Certificate

active

07916565

ABSTRACT:
A semiconductor memory device including a test circuit capable of reducing test time includes a test circuit for generating leakage current in the semiconductor memory device in a standby state in response to a test mode signal and a standby signal that provides standby state information of the semiconductor memory device.

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