Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate
2011-03-01
2011-03-01
Lamarre, Guy J (Department: 2112)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital data error correction
C714S786000, C714S758000, C714S757000
Reexamination Certificate
active
07900117
ABSTRACT:
A semiconductor memory device includes a temporary storage circuit configured to receive data items and store the data items in rows and columns, a detecting code generator configured to generate first detecting codes used to detect errors in the data items, respectively, a first correcting code generator configured to generate first correcting codes used to correct errors in first data blocks corresponding to the columns, respectively, each of the first data blocks containing data items that are arranged in a corresponding one of the columns, and a second correcting code generator configured to generate second correcting codes used to correct errors in second data blocks corresponding to the rows, respectively, each of the second data blocks containing data items that are arranged in a corresponding one of the rows.
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Kabushiki Kaisha Toshiba
Lamarre Guy J
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
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