Cantilever probe structure for a probe card assembly

Details Cantilever probe structure for a probe card assembly Cantilever probe structure for a probe card assembly

2011-08-23

2011-08-23

Velez, Roberto (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S755010, C324S756030

Reexamination Certificate

active

08004299

ABSTRACT:
A probe for a probe card assembly includes a beam and a fulcrum element. The fulcrum element is positioned between a base end portion of the beam and a tip end portion of the beam and is adapted for contact with the beam such that the beam is cantilevered by the fulcrum.

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