Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2008-01-29
2008-01-29
Soward, Ida M. (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257S001000, C257S002000, C257S004000, C257S005000, C257S296000, C257S297000, C257S298000, C257S299000, C257S300000, C257S310000, C257S311000, C257S312000, C257S313000
Reexamination Certificate
active
07323708
ABSTRACT:
A phase change memory device includes a lower electrode and a porous dielectric layer having fine pores on the lower electrode. A phase change layer is provided in the fine pores of the porous dielectric layer. An upper electrode is provided on the phase change layer. Related manufacturing methods are also described.
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Hwang Young-Nam
Lee Se-Ho
Myers Bigel Sibley & Sajovec P.A.
Samsung Electronics Co,. Ltd.
Soward Ida M.
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