Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2011-08-30
2011-08-30
Weiss, Howard (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S328000, C257S330000
Reexamination Certificate
active
08008711
ABSTRACT:
A p-type base layer shaped like a well is formed for each of IGBT cells, and a p+-type collector layer and an n+-type cathode layer are formed on a surface opposite to a surface on which the p-type base layer is formed so as to be situated just below the p-type base layer. The p-type base layer of each of the IGBT cells includes a flat region including an emitter region and a bottom surface penetrated by a main trench, and first and second side diffusion regions between which the flat region is interposed. The first side diffusion region is situated just above the n+-type cathode layer and each of the bottom surfaces of the side diffusion regions forms a parabola-shaped smooth curve in longitudinal section. By replacing the p+-type collector layer with the n+-type cathode layer, it is possible to apply features of the above structure to a power MOSFET.
REFERENCES:
patent: 5162876 (1992-11-01), Kitagawa et al.
patent: 5242845 (1993-09-01), Baba et al.
patent: 5751024 (1998-05-01), Takahashi
patent: 5801408 (1998-09-01), Takahashi
patent: 5864159 (1999-01-01), Takahashi
patent: 5981981 (1999-11-01), Takahashi
patent: 6008518 (1999-12-01), Takahashi
patent: 6040599 (2000-03-01), Takahashi
patent: 6107650 (2000-08-01), Takahashi et al.
patent: 6118150 (2000-09-01), Takahashi
patent: 6198130 (2001-03-01), Nobuto et al.
patent: 6218217 (2001-04-01), Uenishi et al.
patent: 6221721 (2001-04-01), Takahashi
patent: 6323508 (2001-11-01), Takahashi et al.
patent: 6331466 (2001-12-01), Takahashi et al.
patent: 6472693 (2002-10-01), Takahashi et al.
patent: 6639295 (2003-10-01), Majumdar et al.
patent: 6734497 (2004-05-01), Takahashi et al.
patent: 6768168 (2004-07-01), Takahashi
patent: 6781199 (2004-08-01), Takahashi
patent: RE38953 (2006-01-01), Takahashi
patent: 2003/0020134 (2003-01-01), Werner et al.
patent: 2003/0042537 (2003-03-01), Nakamura et al.
patent: 2005/0017290 (2005-01-01), Takahashi et al.
patent: 101 25 268 (2002-08-01), None
patent: 101 24 115 (2003-02-01), None
patent: 4-261065 (1992-09-01), None
patent: 6-53511 (1994-02-01), None
patent: 6-196705 (1994-07-01), None
patent: 7-153942 (1995-06-01), None
patent: 8-116056 (1996-05-01), None
patent: 9-82954 (1997-03-01), None
patent: 11-97715 (1999-04-01), None
patent: 11-195788 (1999-07-01), None
patent: 2000-307116 (2000-11-01), None
patent: 2002-203966 (2002-07-01), None
patent: 2002-203967 (2002-07-01), None
patent: 2002-314082 (2002-10-01), None
patent: 2003-17701 (2003-01-01), None
U.S. Appl. No. 12/099,599, filed Apr. 8, 2002, Takahashi, et al.
Office Action issued Jan. 11, 2011, in Japanese Patent Application No. 2004-115077 (with partial English translation).
Mitsubishi Denki & Kabushiki Kaisha
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
Skyles Tifney L
Weiss Howard
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