Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device
Reexamination Certificate
2011-08-30
2011-08-30
Kelly, Cynthia H (Department: 1722)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Making electrical device
Reexamination Certificate
active
08007985
ABSTRACT:
Semiconductor devices and methods of manufacturing thereof are disclosed. A plurality of features is formed on a workpiece, the plurality of features being located in a first region and a second region of the workpiece. Features in the first region have a first lateral dimension, and features in the second region have a second lateral dimension, wherein the second lateral dimension is greater than the first lateral dimension. The first region is masked, and the second lateral dimension of features in the second region is reduced.
REFERENCES:
patent: 6013570 (2000-01-01), Yu et al.
patent: 2002/0142252 (2002-10-01), Ng
patent: 2003/0045118 (2003-03-01), Wu et al.
patent: 2004/0198030 (2004-10-01), Buehrer et al.
Gutmann Alois
Lian Jingyu
Lipinski Matthias
Sarma Chandrasekhar
Zhuang Haoren
Infineon - Technologies AG
Kelly Cynthia H
Raymond Brittany
Slater & Matsil L.L.P.
LandOfFree
Semiconductor devices and methods of manufacturing thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor devices and methods of manufacturing thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor devices and methods of manufacturing thereof will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2763914