Sequential deposition process for forming Si-containing films

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching

Reexamination Certificate

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C257SE21356

Reexamination Certificate

active

07358194

ABSTRACT:
A method is provided for forming a Si film in sequential deposition process. The method includes providing a substrate in a process chamber, forming a chlorinated Si film by exposing the substrate to a chlorinated silane gas, and dry etching the chlorinated Si film to reduce the chlorine content of the Si film. The Si film may be deposited selectively or non-selectively on the substrate and the deposition may be self-limiting or non-self-limiting. Other embodiments provide a method for forming SiGe films in a sequential deposition process.

REFERENCES:
patent: 4625224 (1986-11-01), Nakagawa et al.
patent: 2003/0143328 (2003-07-01), Chen et al.
patent: 2004/0152287 (2004-08-01), Sherrill et al.
patent: 2004/0175893 (2004-09-01), Vatus et al.
patent: 2005/0066892 (2005-03-01), Dip et al.
patent: 2005/0184348 (2005-08-01), Youn et al.
patent: 2006/0021570 (2006-02-01), Hasebe et al.

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