Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2008-04-15
2008-04-15
Lam, David (Department: 2827)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S201000, C365S230060
Reexamination Certificate
active
07359261
ABSTRACT:
An IC includes a memory module that stores at least one of data and code. A memory repair database stores data relating to defective memory addresses. A memory control module communicates with the memory module and the memory repair database, detects defective memory locations in the memory module, locates redundant memory elements in the memory module, stores information that associates memory addresses of the defective memory locations with the redundant memory elements in the memory repair database, and outputs the information. The memory control module includes a plurality of electrical fuses. Storing the information includes electrically altering at least one of the plurality of electrical fuses. A redundant memory decoder module receives the information and physically remaps the memory addresses to the redundant memory locations.
REFERENCES:
patent: 4250570 (1981-02-01), Tsang et al.
patent: 6449197 (2002-09-01), Hiraki et al.
patent: 6940765 (2005-09-01), Kyung
Self-Repair Boosts Memory SoC Yields; Vincent Ratford; CommsDesign.com; Sep. 5, 2001; 6 pages.
Sutardja Sehat
Wu Albert
Lam David
Marvell International Ltd.
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