Manufacturing method of microelectromechanical system

Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Physical stress responsive

Reexamination Certificate

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C257SE29324

Reexamination Certificate

active

07875483

ABSTRACT:
To provide a method of easily forming a three-dimensional structure typified by a cantilever by using a thin film formed over an insulating surface, and provide a microelectromechanical system formed by such a method. A three-dimensional structure typified by a cantilever is formed by using a mask having a nonuniform thickness. Specifically, a microstructure is manufactured by processing a structural layer formed over a sacrificial layer by using a mask having a nonuniform thickness and then removing the sacrificial layer. The sacrificial layer can be formed by using a silicon layer or a metal layer.

REFERENCES:
patent: 6495387 (2002-12-01), French
patent: 2002/0025591 (2002-02-01), Ohnuma et al.
patent: 2005/0034822 (2005-02-01), Kim et al.
patent: 2006/0014335 (2006-01-01), Ohnuma et al.
patent: 1 471 637 (2004-10-01), None
patent: 2002-151523 (2002-05-01), None
patent: 2004-328745 (2004-11-01), None

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