Thin film transistor and manufacturing method of the same

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE21101

Reexamination Certificate

active

07932137

ABSTRACT:
To achieve TFT having a high light-resistance characteristic with a suppressed light leak current at low cost by simplifying the manufacturing processes. The TFT basically includes a light-shielding film formed on a glass substrate that serves as an insulating substrate; an insulating film formed on the light-shielding film; a semiconductor film formed on the insulating film; and a gate insulating film formed on the semiconductor film. Each layer of a laminate that is configured with three layers of the light-shielding film, the insulating film, and the semiconductor film is patterned simultaneously. Further, each layer of the laminate is configured with silicon or a material containing silicon.

REFERENCES:
patent: 5605847 (1997-02-01), Zhang
patent: 6875674 (2005-04-01), Asami et al.
patent: 7202115 (2007-04-01), Hirano et al.
patent: 2005/0156239 (2005-07-01), Seko et al.
patent: 2008/0296580 (2008-12-01), Mori et al.
patent: 09-213964 (1997-08-01), None
patent: 2004-302475 (2004-10-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Thin film transistor and manufacturing method of the same does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Thin film transistor and manufacturing method of the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Thin film transistor and manufacturing method of the same will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2737725

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.