Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2011-04-12
2011-04-12
Prenty, Mark (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C438S589000
Reexamination Certificate
active
07923773
ABSTRACT:
A bottom of a gate trench has a first bottom relatively far from an STI and a second bottom relatively near from the STI. A portion, in an active region, configuring the second bottom of the gate trench configures a side-wall channel region, and has a thin-film SOI structure sandwiched between the gate electrode and the STI. On the other hand, a portion configuring the first bottom of the gate trench functions as a sub-channel region. A curvature radius of the second bottom is larger than a curvature radius of the first bottom. In an approximate center in a length direction of the gate trench, a bottom of a trench is approximately flat, and on the other hand, in ends of the length direction, a nearly whole bottom of the trench is curved.
REFERENCES:
patent: 7189617 (2007-03-01), Slesazeck et al.
patent: 08-274277 (1996-10-01), None
Elpida Memory Inc.
Prenty Mark
Young & Thompson
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