Methods of forming CoSi 2 , methods of forming field effect...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S655000, C438S664000, C438S682000

Reexamination Certificate

active

07989340

ABSTRACT:
The invention included to methods of forming CoSi2, methods of forming field effect transistors, and methods of forming conductive contacts. In one implementation, a method of forming CoSi2includes forming a substantially amorphous layer comprising MSixover a silicon-containing substrate, where “M” comprises at least some metal other than cobalt. A layer comprising cobalt is deposited over the substantially amorphous MSix-comprising layer. The substrate is annealed effective to diffuse cobalt of the cobalt-comprising layer through the substantially amorphous MSix-comprising layer and combine with silicon of the silicon-containing substrate to form CoSi2beneath the substantially amorphous MSix-comprising layer. Other aspects and implementations are contemplated.

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