Phase change memory, phase change memory assembly, phase...

Static information storage and retrieval – Systems using particular element – Amorphous

Reexamination Certificate

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C365S100000, C365S148000, C257S002000, C257S296000

Reexamination Certificate

active

07876605

ABSTRACT:
A phase change memory having a memory material layer consisting of a phase change material, and a first and second electrical contact which are located at a distance from one another and via which a switching zone of the memory material layer can be traversed by a current signal, wherein the current signal can be used to induce a reversible phase change between a crystalline phase and an amorphous phase and thus a change in resistance of the phase change material in the switching zone. The invention also relates to a phase change memory assembly, a phase change memory cell, a 2D phase change memory cell array, a 3D phase change memory cell array and an electronic component.

REFERENCES:
patent: 3448302 (1969-06-01), Shanefield
patent: 4420766 (1983-12-01), Kasten
patent: 4599705 (1986-07-01), Holmberg et al.
patent: 4795657 (1989-01-01), Formigoni et al.
patent: 5049971 (1991-09-01), Krumm
patent: 5933365 (1999-08-01), Klersy et al.
patent: 6087689 (2000-07-01), Reinberg
patent: 6287887 (2001-09-01), Gilgen
patent: 6473332 (2002-10-01), Ignatiev et al.
patent: 6525953 (2003-02-01), Johnson
patent: 6815704 (2004-11-01), Chen
patent: 6854033 (2005-02-01), Solomon et al.
patent: 7214632 (2007-05-01), Chiang
patent: 7227171 (2007-06-01), Bez et al.
patent: 7358521 (2008-04-01), Wicker
patent: 7791059 (2010-09-01), Jedema et al.
patent: 2008/0002457 (2008-01-01), Toda et al.
patent: 2010/0188892 (2010-07-01), Baks
patent: WO 2004/057618 (2004-07-01), None
Geppert, Semiconductors, The New Indelible Memories, IEEE Spectrum, Mar. 2003, pp. 49-54.
Lai et al., OUM—A 180 nm Nonvolatile Memory Cell Element Technology for Stand Alone and Embedded Applications, IEDM 01-803, 2001, pp. 36.5.1-36-5.4, Santa Clara, CA.
Ovshinsky, Reversible Electrical Switching Phenomena in Disordered Structures, Physical Review Letters, Nov. 11, 1968, pp. 1450-1455, vol. 21, No. 20, Energy Conversion Devices, Inc., Troy Michigan.
Tyson et al., Nonvolatile, High Density, High Performance Phase-Change Memory, Mar. 18, 2000, pp. 385-390.

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