Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2011-08-16
2011-08-16
Cao, Phat X (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S329000, C257S330000, C257S331000, C257SE29254, C257SE29255, C257SE29256, C257SE29257, C257SE29262, C438S259000, C438S268000, C438S270000, C438S237000
Reexamination Certificate
active
07999314
ABSTRACT:
A semiconductor device includes an n-conductive type semiconductor substrate having a main side and a rear side, a p-conductive type layer arranged over the main side of the substrate, a main side n-conductive type region arranged in the p-conductive type layer, a rear side n-conductive type layer arranged over the rear side of the substrate, a first trench which reaches the substrate and penetrates the main side n-conductive type region and the p-conductive type layer, a second trench which reaches an inside of the p-conductive type layer, a second electrode layer, which is embedded in the second trench and connected to the p-conductive type layer. Hereby, the semiconductor device, in which the recovery property of a diode cell can be improved without damaging the property of a MOS transistor cell or an IGBT cell and the surge withstand property does not deteriorate, can be obtained.
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Office Action mailed Dec. 1, 2009 from the Japan Patent Office for corresponding patent application No. 2008-153327 (English translation enclosed).
Asai Makoto
Tsuzuki Yukio
Cao Phat X
Denso Corporation
Garrity Diana C
Posz Law Group , PLC
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