Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2011-07-12
2011-07-12
Smith, Zandra (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S306000
Reexamination Certificate
active
07977720
ABSTRACT:
To securely prevent hydrogen from entering a ferroelectric layer of a ferroelectric memory. A first hydrogen barrier layer5is formed on the lower side of ferroelectric capacitors7. Upper surfaces and side surfaces of the ferroelectric capacitors7are covered by a second hydrogen barrier layer. All upper electrodes7cof the plural ferroelectric capacitors7to be connected to a common plate line P are connected to one another by an upper wiring layer91. The upper wiring layer91is connected to the plate line P through a lower wiring32provided below the ferroelectric capacitors7. A third hydrogen barrier layer92is formed on the upper wiring layer91such that all edge sections92aof the third hydrogen barrier layer92come in contact with the first hydrogen barrier layer5.
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IMFEDK, Session F: Reliability Physics and Quality, 2003, p. 88.
Oliff & Berridg,e PLC
Patton Paul E
Seiko Epson Corporation
Smith Zandra
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