Ferroelectric memory and its manufacturing method

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S306000

Reexamination Certificate

active

07977720

ABSTRACT:
To securely prevent hydrogen from entering a ferroelectric layer of a ferroelectric memory. A first hydrogen barrier layer5is formed on the lower side of ferroelectric capacitors7. Upper surfaces and side surfaces of the ferroelectric capacitors7are covered by a second hydrogen barrier layer. All upper electrodes7cof the plural ferroelectric capacitors7to be connected to a common plate line P are connected to one another by an upper wiring layer91. The upper wiring layer91is connected to the plate line P through a lower wiring32provided below the ferroelectric capacitors7. A third hydrogen barrier layer92is formed on the upper wiring layer91such that all edge sections92aof the third hydrogen barrier layer92come in contact with the first hydrogen barrier layer5.

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patent: 6613586 (2003-09-01), Bailey
patent: 7060552 (2006-06-01), Mikawa et al.
patent: 7514735 (2009-04-01), Fukada
patent: 2002/0195633 (2002-12-01), Nagano et al.
patent: 2005/0199928 (2005-09-01), Mikawa et al.
patent: 2006/0244025 (2006-11-01), Yamanobe
patent: A 11-135736 (1999-05-01), None
patent: A 2003-174145 (2003-06-01), None
IMFEDK, Session F: Reliability Physics and Quality, 2003, p. 88.

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