Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-01-18
2011-01-18
Tang, Minh N (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C361S748000, C361S777000
Reexamination Certificate
active
07872483
ABSTRACT:
An electronic device having a printed circuit board is provided. In one embodiment, the printed circuit board includes a plurality of external pads to be coupled with an external device and a plurality of bypass pads for testing an electric circuit. The external pads are exposed and at least one of the plurality of bypass pads are not exposed from an outer surface of the PCB. A system using the electronic device and a method of testing an electronic device are also provided.
REFERENCES:
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patent: 2005/0013106 (2005-01-01), Takiar
Han Sang-Guk
Moon Seok-Joon
Muir Patent Consulting, PLLC
Samsung Electronics Co,. Ltd.
Tang Minh N
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