Semiconductor memory device having a sense amplifier circuit...

Static information storage and retrieval – Read/write circuit – Particular read circuit

Reexamination Certificate

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Details

C365S190000, C365S196000, C365S208000, C365S207000, C365S205000, C365S189050

Reexamination Certificate

active

07876627

ABSTRACT:
A semiconductor memory device having high integration, low power consumption and high operation speed. The memory device includes a sense amplifier circuit having plural pull-down circuits and a pull-up circuit. A transistor constituting one of the plural pull-down circuits has a larger constant than that of a transistor constituting the other pull-down circuits, for example, a channel length and a channel width. The pull-down circuit having the larger constant transistor is activated earlier than the other pull-down circuits and the pull-up circuit, which are activated to conduct reading. The data line and the earlier driven pull-down circuit are connected by an NMOS transistor and the NMOS transistor is activated or inactivated to control the activation or inactivation of the pull-down circuit.

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Hong et al., “An Offset Cancellation Bit-line Sensing Scheme for Low-Voltage DRAM Applications,” ISSCC 2002 IEEE International Solid-State Conference, Digest of Technical Papers, pp. 154-155.
Sim et al., “Charge-Transferred Presensing and Efficiently Precharged Negative Word-Line Schemes for Low-Voltage DRAMs,” 2003 Symposium on VLSI Circuits Digest of Technical Papers, 2003, p. 289-292.

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