Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2011-03-08
2011-03-08
Jackson, Jr., Jerome (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S314000, C257SE21422
Reexamination Certificate
active
07902587
ABSTRACT:
A non-volatile memory cell is described, including a semiconductor substrate, two separate charge trapping structures on the substrate, first spacers at least on the opposite sidewalls of the two charge trapping structures, a gate dielectric layer on the substrate between the two charge trapping structures, a gate on the two charge trapping structures and the gate dielectric layer, and two doped regions in the substrate beside the gate.
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Chu Tsan-Chi
Shih Hung-Lin
Budd Paul A
Hsu Winston
Jackson, Jr. Jerome
Margo Scott
United Microelectronics Corp.
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