Method of forming a low resistance semiconductor contact and...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

Other Related Categories

C257S328000, C257S329000, C257S335000, C257S341000, C257S342000, C257S383000, C257S384000, C257S385000, C257S401000, C257S550000, C257S754000

Type

Reexamination Certificate

Status

active

Patent number

07939897

Description

ABSTRACT:
In one embodiment, silicide layers are formed on two oppositely doped adjacent semiconductor regions. A conductor material is formed electrically contacting both of the two silicides.

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