Thin-film device, method for manufacturing thin-film device,...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer

Reexamination Certificate

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Details

C438S149000, C438S151000, C438S155000, C257S071000, C257S072000, C257SE29117, C257SE29151, C257SE29273, C257SE27112, C257SE21094, C257SE21104, C257SE21411, C257SE21414

Reexamination Certificate

active

07968388

ABSTRACT:
A method for manufacturing a thin-film device includes forming a separation layer on a substrate, forming a base insulating layer on the separation layer, forming a thin-film device layer on the base insulating layer, bonding a transfer layer including the base insulating layer and the thin-film device layer to a transfer body with an adhesive, causing intralayer delamination or interfacial delamination in the separation layer, and removing the transfer layer from the substrate. The thin-film device layer includes a first wiring sublayer which is located at the bottom of the thin-film device layer and which is in contact with the base insulating layer, a dielectric sublayer which is in contact with a surface of the first wiring sublayer, a semiconductor sublayer electrically insulated from the first wiring sublayer with the dielectric sublayer, and a second wiring sublayer formed subsequently to the semiconductor sublayer. The first wiring sublayer includes electrodes located at the bottom of the thin-film device layer.

REFERENCES:
patent: 2003/0040164 (2003-02-01), Inoue et al.
patent: 2006/0138428 (2006-06-01), Ahn et al.
patent: 2006/0202202 (2006-09-01), Denda et al.
patent: 2009/0032819 (2009-02-01), Lim et al.
patent: 10-125931 (1998-05-01), None
patent: 2001-125138 (2001-05-01), None
patent: 2007-288078 (2007-11-01), None
patent: 2007-288080 (2007-11-01), None

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