Optical sensor device

Optics: measuring and testing – By polarized light examination – Of surface reflection

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356356, 356355, 356 731, 356237, G01J 400

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active

058446826

ABSTRACT:
Whether or not an object is present, the surface state of the object, the material constituting the object and the presence of scattering bodies are discriminated through a simple arrangement which includes a light-emitting element for projecting light upon an object to be sensed, and a polarization beam splitter upon which light reflected from the object (or light transmitted through or scattered from the object) impinges. Reflected light from the polarization beam splitter is received by a first light-receiving element, and transmitted light from the polarization beam splitter is received by a second light-receiving element. The aforesaid discrimination is performed on the basis of the value of S/P, S-P, S-kP or (S-P)/(S+P), where S and P represent light-reception signals from the first and second light-receiving elements, and k is a constant.

REFERENCES:
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patent: 4318003 (1982-03-01), Ono et al.
patent: 4919534 (1990-04-01), Reed
patent: 5139339 (1992-08-01), Courtney et al.
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patent: 5198575 (1993-03-01), Bazin et al.
patent: 5554262 (1996-09-01), Turner
patent: 5570217 (1996-10-01), Fleuren
"Thin-Film Optical Filters," H.A. Macleod (Japanese translation).
"Optical Thin Films", S. Fujiwara.

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