Probe control method for leveling probe pins for a probe test se

Details Probe control method for leveling probe pins for a probe test se Probe control method for leveling probe pins for a probe test se

1996-05-16

1998-12-01

Ballato, Josie

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324754, G01R 3102

Patent

active

058444211

ABSTRACT:
A probe control method of a probe station which levels the probe pins before testing a large area substrate such as a thin film transistor circuit substrate using a probe station, which includes the steps of connecting a pin of a probe station to a resistance material; measuring and reading the resistance between adjacent pins using a resistance measuring device; and leveling the probe pins using a pin control device at the probe station.

REFERENCES:
patent: 4565966 (1986-01-01), Burr et al.
patent: 4918374 (1990-04-01), Stewart et al.
patent: 4975638 (1990-12-01), Evans et al.
patent: 5006808 (1991-04-01), Watts
patent: 5065092 (1991-11-01), Sigler
patent: 5561377 (1996-10-01), Strid et al.
patent: 5659255 (1997-08-01), Strid et al.
patent: 5691467 (1997-11-01), Goldmann et al.

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