Scanning ion conductance microscope

Details Scanning ion conductance microscope Scanning ion conductance microscope

1989-02-01

1990-05-08

Anderson, Bruce C.

Radiant energy

Inspection of solids or liquids by charged particles

250423F, G21K 508

Patent

active

049240919

ABSTRACT:
A scanning ion conductance microscope, SICM, which can image the topography of soft non-conducting surfaces covered with electrolytes by maintaining a micropipette probe at a constant conductance distance from the surface. It can also sample and image the local ion currents above the surfaces by scanning the micropipette probe in a plane located at a constant distance above the surface. Multiple micropipettes mounted in a multi-barrel head and containing various ion specific electrodes allow simultaneous scanning for different ion currents.

REFERENCES:
patent: 4868396 (1989-09-01), Lindsay
"Scanning Tunneling Microscope for Electrochemistry-a New Concept for the In Situ Scanning Tunneling Micro. in Electrolyte Solutions", Itaya et al., Surface Sci. Letters, Jul. 88, 201 pp. L507-L512.
"Tunneling Microscopy in an Electrochemical Cell: Images of Ag Plating" Sonnenfeld, et al., App. Phy. Lett. vol. 49, No. 18, Nov. 3, 1986, pp. 1172-1174.
"The Scanning Ion-Conductance Microscope", Hansma et al., Science, vol. 243, pp. 641-643, Feb. 3, 1989.

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