Thin film transistor matrix device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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257 49, 257 57, 257 59, 257 66, 257 72, H01L 2184

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active

061304565

ABSTRACT:
A thin film transistor matrix device comprises an insulating substrate, a plurality of picture element electrodes arranged in a matrix on the insulating substrate, source electrodes connected to the respective picture element electrodes, drain electrodes opposed to the respective source electrodes, operational semiconductor layers sandwiched by the source electrodes and the drain electrodes, and gate electrodes formed on the operational semiconductor layers through gate insulating films, each gate electrode being narrowed with respect to the associated gate insulating film so that side walls of the gate electrode forms a step with respect to side walls of the associated gate insulating film which is a substrate of the gate electrode. The gate electrode is made narrower with respect to the gate insulating film to form a step between the side walls of the gate electrode with respect to those of the gate insulating film, whereby leak currents from the source electrode or the drain electrode to the gate electrode along the mesa side surfaces of the TFT can be simply suppressed. Accordingly a TFT matrix device having little wasteful current consumption can be realized.

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F. Mohammadi, "Silicides for Interconnection Technology", Solid State Technology (Jan. 1981) pp. 65-72.
S. M. Sze, Semiconductor Devices Physics and Technology, John Wiley & Sons, New York (1985) p. 344.
F. A. Cotton et al., Advanced Inorganic Chemistry, Interscience Publishers (1962) p. 336.

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