Semiconductor memory device and manufacturing method thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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257655, H01L 27108

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active

057238871

ABSTRACT:
A storage node electrode formed of doped amorphous silicon is provided on a silicon substrate. Silicon crystal grains are formed on the surface of the storage node electrode by annealing it in the atmosphere including PH.sub.3. A capacitor insulating film and a cell plate electrode are formed to cover the surface of the storage node electrode including silicon crystal grains. Larger silicon crystal grains are accordingly provided on the surface of the storage node electrode, resulting in increased capacitance of the capacitor.

REFERENCES:
patent: 5612558 (1997-03-01), Harshfield
patent: 5623243 (1997-04-01), Watanabe et al.
Applied Physics, vol. 61, No. 11, pp. 1147-1151, by Watanabe, Sep. 1992.

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