Random access memory cell resistant to inadvertant change of sta

Static information storage and retrieval – Systems using particular element – Flip-flop

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365190, G11C 1140

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active

047259817

ABSTRACT:
A static MOS RAM cell is provided that is resistant to inadvertent change of state due to charged particles striking the cell without decreasing write time. First and second cross-coupled transistors are coupled between first and second nodes, respectively, and a first voltage. First and second loads are coupled between the first and second nodes, respectively, and a second voltage. A first coupling transistor is coupled between the first node and a first input terminal, and has a gate coupled for receiving a write signal. A second coupling transistor is coupled between the second node and a second input terminal, and has a gate coupled for receiving the write signal. First and second variable loads are coupled between the first node and a gate of the second latching transistor, and the second node and a gate of the first latching transistor, respectively, for providing a resistance in the standby mode and relatively no resistance in the write mode.

REFERENCES:
patent: 4130892 (1978-12-01), Gunckel, II et al.

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