Structure formed by a method of patterning a submicron semicondu

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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257640, 257637, 257758, 257751, 257774, 257900, H01L 2348

Patent

active

053230477

ABSTRACT:
A method is provided for patterning a submicron semiconductor layer of an integrated circuit, and an integrated circuit formed according to the same. An interlevel dielectric layer is formed over the surface of the integrated circuit. A substantially planarizing layer is formed over the interlevel dielectric layer. A photoresist layer is formed and patterned over the planarizing layer. The planarizing layer is etched to form openings exposing selected portions of the interlevel dielectric layer, wherein each opening has substantially the same lateral dimensions. The photoresist and planarizing layers are then removed. The interlevel dielectric layer is etched in the openings to expose portions of the underlying integrated circuit.

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patent: 5043790 (1991-08-01), Butler
patent: 5055423 (1991-10-01), Smith et al.
patent: 5126231 (1992-06-01), Levy

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