Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1997-04-14
2000-09-05
Snow, Walter E.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324 725, G01R 1073, G01R 3126
Patent
active
061148644
ABSTRACT:
A probe card comprises the following elements. An insulation film is provided which is flexible and extends on a first surface of a substrate. The insulation film has a first surface in contact with the first surface of the substrate, to form a space region which is defined between the first surface of the substrate and the first surface of the insulation film so as to allow part of the insulation film to move into the space. Probe patterns extend on a second surface of the insulation film so that the probe patterns.
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patent: 5172050 (1992-10-01), Swapp
patent: 5191708 (1993-03-01), Kasukabe et al.
patent: 5444386 (1995-08-01), Mizumura
Senba Naoji
Soejima Koji
NEC Corporation
Snow Walter E.
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