Method for making submicron mask openings using sidewall and lif

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

29576R, 29576J, 156632, 156638, 156643, 156653, 156657, H01L 21306

Patent

active

046541195

ABSTRACT:
A method is disclosed for making submicron openings in a substrate. A mesa is formed on the substrate by reactive ion etching techniques. A film is deposited over the entire structure and the mesa is selectively etched away to yield a submicron-sized opening in the film. Using the film as a mask, the substrate exposed thereby is reactively ion etched. An example is given for producing an emitter mask for a polycrystalline silicon base bipolar transistor.

REFERENCES:
patent: 3982943 (1976-09-01), Feng et al.
patent: 4209349 (1980-06-01), Ho et al.
patent: 4274909 (1981-06-01), Venkataraman et al.
patent: 4387145 (1983-06-01), Lehrer et al.
patent: 4430791 (1984-02-01), Dockerty
patent: 4563241 (1986-01-01), Tanaka et al.
patent: 4572765 (1986-02-01), Berry
patent: 4575924 (1986-03-01), Reed et al.
IBM Technical Disclosure Bulletin, by R. P. Each et al, "Obtaining Evaporated Metal Patterns on Substrates," vol. 9, No. 4, Sep. 1966, pp. 348-349.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for making submicron mask openings using sidewall and lif does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for making submicron mask openings using sidewall and lif, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for making submicron mask openings using sidewall and lif will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2211576

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.