Semiconductor device having a through-hole formed on diffused la

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257301, 257307, 257308, 257903, 438254, 438397, H01L 27108

Patent

active

057639108

ABSTRACT:
The present invention relates to a semiconductor device whose through-holes are formed by self-alignment and a method for fabricating the same. The through-holes formed on the gate electrodes can be formed simultaneously with SACs without complicating the fabrication process. The semiconductor device comprises a semiconductor substrate, a device isolation film defining devices regions on the semiconductor substrate, a pair of diffused layers formed in the device regions, gate electrodes formed through a first insulation film on the semiconductor substrate between the pair of diffused layers, and an etching stopper film covering side walls of the gate electrodes and parts of top surfaces of the gate electrodes which are extended inward by a prescribed distance from peripheral edges thereof. Whereby through-holes of an SAC structure can be formed in a later step, and the through-holes can be formed to expose the gate electrodes without removing the etching stopper film.

REFERENCES:
patent: 5384276 (1995-01-01), Ogawa et al.
patent: 5498889 (1996-03-01), Hayden

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device having a through-hole formed on diffused la does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device having a through-hole formed on diffused la, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device having a through-hole formed on diffused la will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2203322

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.