Structure capable of simultaneously testing redundant and non-re

Details Structure capable of simultaneously testing redundant and non-re Structure capable of simultaneously testing redundant and non-re

1994-04-29

1996-06-25

Nelms, David C.

Static information storage and retrieval

Read/write circuit

Testing

365200, 36523008, 36523003, 3652257, 36523006, 371 211, G11C 2900

Patent

active

055306748

ABSTRACT:
The redundant elements of an integrated circuit memory device having a plurality of redundant and non-redundant elements such as rows, columns, wordlines, and blocks, may be selectively enabled during a stress test mode so that both redundant elements and non-redundant elements may be stress tested concurrently. Enabling capabilities contained within the redundant element circuitry selectively enables the redundant elements when a stress test signal is equal to a predetermined value, indicative of a stress test mode.

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patent: 5404331 (1995-04-01), McClure

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