Method of measuring characteristics of a multilayer electronic c

Details Method of measuring characteristics of a multilayer electronic c Method of measuring characteristics of a multilayer electronic c

1994-04-13

1996-02-06

Hall, Carl E.

Metal working

Method of mechanical manufacture

Electrical device making

29 2542, 29854, 296021, H01R 4300

Patent

active

054887658

ABSTRACT:
In order to provide a multilayer electronic component which can reduce arrangement pitches for external electrodes, via holes filled up with conductive materials are provided in a mother laminate, which is obtained by stacking a plurality of insulating sheets with interposition of conductor films, in positions parted by cutting. The conductive materials define external electrodes of individual multilayer electronic components which are obtained by cutting the mother laminate. No specific step is required for forming the external electrodes, and characteristics of each multilayer electronic component can be efficiently measured in the state of the mother laminate.

REFERENCES:
patent: 5140745 (1992-08-01), McKenzie, Jr.

Affiliated with

Also associated with

Rating

Method of measuring characteristics of a multilayer electronic c does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of measuring characteristics of a multilayer electronic c, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of measuring characteristics of a multilayer electronic c will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2169664