Fishing – trapping – and vermin destroying
Patent
1992-02-07
1994-12-06
Thomas, Tom
Fishing, trapping, and vermin destroying
437190, 437194, 148DIG147, H01L 2144
Patent
active
053710410
ABSTRACT:
A method for forming a connection between two levels in a semiconductor structure includes first forming a VIA (14) through an insulating layer (12) to an underlying structure (10). Sidewall spacers (22) and (24) are formed on the vertical walls of the VIA (14). The spacers (22) and (24) have tapered surfaces. A barrier layer (30) is then formed over the bottom surface of the VIA followed by CVD deposition of a conductive layer (32) of WSi.sub.2 to provide a conformal conductive layer. An aluminum layer (38) is then deposited by physical vapor deposition techniques with the descending portions of layer (32) providing a conductive connection between the aluminum layer (38) and the lower structure (10) in the VIA (14).
REFERENCES:
patent: 3953266 (1976-04-01), Takai
patent: 4398335 (1983-08-01), Lehrer
patent: 4489481 (1984-12-01), Jones
patent: 4566026 (1986-01-01), Lee et al.
patent: 4640004 (1987-02-01), Thomas et al.
patent: 4680612 (1987-07-01), Hieber et al.
patent: 4751198 (1988-06-01), Anderson
patent: 4772571 (1988-09-01), Scovell et al.
patent: 4784973 (1988-11-01), Stevens et al.
patent: 4829024 (1989-05-01), Klein et al.
patent: 4851295 (1989-07-01), Brors
patent: 4851369 (1989-07-01), Ellwanger et al.
patent: 4884123 (1989-11-01), Dixit et al.
patent: 4910578 (1990-03-01), Okamoto
patent: 4920071 (1990-04-01), Thomas
patent: 4963511 (1990-10-01), Smith
patent: 5227335 (1993-07-01), Holschwandner et al.
High Aspect Ratio Hole Filling by WCVD . . . ; Suguro et al. J. Appl. Phys. 62(4); 15 Aug. 1987; pp. 1265-1273.
Farohani Mohammed M.
Han Yu-Pin
Liou Fu-Tai
Miller Robert O.
Hill Kenneth C.
Howison Gregory M.
Jorgenson Lisa K.
SGS-Thomson Microelectronics Inc.
Thomas Tom
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