Semiconductor memory device having two layers of bit lines arran

Static information storage and retrieval – Read/write circuit – Bad bit

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365 63, 365 51, G11C 700, G11C 506

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active

056993080

ABSTRACT:
In a semiconductor memory cell array including word lines, bit lines, and a plurality of memory cells arranged at crossings between the word lines and the bit lines, the bit lines are grouped into odd and even numbered groups. A shift redundancy circuit is arranged between each group of odd or even bit lines and sense amplifier and write circuits for the purpose of shifting a defective memory cell to a redundant memory cell.

REFERENCES:
patent: 4367540 (1983-01-01), Shimohigashi
patent: 4907203 (1990-03-01), Wada et al.
patent: 5014241 (1991-05-01), Asakura et al.
patent: 5214641 (1993-05-01), Hidaka et al.
patent: 5280441 (1994-01-01), Wada et al.
"Bit Line Configuration Suitable for Very High Speed SRAM - T-Shaped Bit Line Configuration and Application to BiCMOS 256K TTL SRAM", T. Kenkyukai et al., pp. 117-123, Jun. 21, 1991.
"A 5.8-NS 256-KB BiCMOS TTL SRAM with T-shaped Bit Line Architecture", Toru Shiomi et al., IEEE Journal of Solid-State Circuits, vol. 28, No. 12, Dec. 1993.
"New Bit Line Architecture for Ultra High Speed SRAMS", Shiomi et al., IEEE 1991 Custom Integrated Circuits Conference.

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