Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Patent
1997-02-25
2000-06-13
Booth, Richard
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
On insulating substrate or layer
438302, 438525, 438592, H01L 2184
Patent
active
060749008
ABSTRACT:
In producing a top gate type or a bottom gate type thin film transistor (TFT), after a metal film for forming silicide is formed on a semiconductor active layer provided on an insulating surface, an N-type or P-type impurity ion is introduced into the semiconductor active layer using an anodizable gate electrode and an anodic oxide formed on the surface of the gate electrode as masks. The exposing portion of the semiconductor active layer is reacted with the metal film, so that a silicide layer is formed in the portion. Then, non-reacted portion of the metal film is removed.
REFERENCES:
patent: 5202277 (1993-04-01), Kameyama et al.
patent: 5393687 (1995-02-01), Liang
patent: 5403759 (1995-04-01), Havemann
patent: 5407837 (1995-04-01), Eklund
patent: 5426064 (1995-06-01), Zhang et al.
patent: 5459090 (1995-10-01), Yamazaki et al.
patent: 5508209 (1996-04-01), Zhang et al.
patent: 5545571 (1996-08-01), Yamazaki et al.
Wolf et al., "Silicon Processing for the VLSI Era Vol. 1: Process Technology", Lattice Press, pp. 292-294, 1986.
Takemura Yasuhiko
Yamazaki Shunpei
Booth Richard
Robinson Eric J.
Semiconductor Energy Laboratory Co,. Ltd.
LandOfFree
Method for producing semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for producing semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for producing semiconductor device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2067875