Dual port memory having testing circuit

Details Dual port memory having testing circuit Dual port memory having testing circuit

1994-08-25

1996-11-26

Beausoliel, Robert W.

Excavating

371 211, 371 213, G01R 1512, G11C 2900

Patent

active

055793223

ABSTRACT:
An object of the present invention is to provide an embedded testing circuit of a dual port memory capable of effectively testing the memory using a short test pattern while making simultaneous write/read from both of the ports.
The testing circuit comprises an address inputting circuit selectively supplying M-sequence pattern data or their inverted pattern data to scan registers on the port A at the address input side and also selectively supplying pattern data in inverse relationship to the pattern data supplied to the port A to scan registers on the port B and a data inputting circuit selectively supplying the M-sequence pattern data or their inverted pattern data passed through the scan registers on the port A at the address input side to scan registers on the port A at the data input side and also selectively supplying the inverted pattern data or the M-sequence pattern data passed through the scan registers on the port B at the address input side to scan registers on the port B at the data input side.

REFERENCES:
patent: 3961252 (1976-06-01), Eichelberger
patent: 5040150 (1991-08-01), Naitoh et al.
patent: 5222067 (1993-06-01), Hiroshi
Conference Paper; Built-in Self Test in Multi-Post RAMS Castro, A. V.; Nicolaidis, M; Lestrat, P; Courtois, B. 1991 IEEE International Conference on Computer aided Design pp. 248-251.
"Built-in self test for Multi-port Rams" by V. Castro Alves, M. Nicolaidis, P. Lestrat and B. Courtois.

Affiliated with

Also associated with

Rating

Dual port memory having testing circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Dual port memory having testing circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dual port memory having testing circuit will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1978948