Method of testing semiconductor device and test apparatus for th

Details Method of testing semiconductor device and test apparatus for th Method of testing semiconductor device and test apparatus for th

1995-03-20

1996-11-26

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324754, G01R 3126

Patent

active

055789196

ABSTRACT:
A tape carrier includes an elongated electrically insulating tape divided into a plurality of separable tape sections. A semiconductor chip is mounted at each of a plurality of semiconductor device mounting portions having a plurality of leads on each of the tape sections. The semiconductor chips are connected to the respective leads. A plurality of testing connection terminals on each of the tape sections are connected to respective testing connection terminals by testing wires.

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patent: 5302891 (1994-04-01), Wood et al.
patent: 5378981 (1995-01-01), Higgins, III
patent: 5396185 (1995-03-01), Honma et al.

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