4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Responsive to non-electrical signal
  6. Physical deformation

Shinji Enoshima

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Method of testing semiconductor device and test apparatus for th

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Tape carrier, and test apparatus for the same

Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Physical deformation
Patent

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Profile ID: LFUS-PAI-P-1734134

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